Welcome to the Beyond Topography: New Advances in AFM Characterization of Polymers Webinar!Thursday, May 28th, 2015 at 11:00 AM EDT
Moderator: Ben Ohler, Oxford Instruments Asylum Research
Sponsored by: Oxford Instruments Asylum Research
Whether investigating fundamental research principles or engineering a specific product, the atomic force microscope (AFM) is a key instrument for evaluating polymers and polymer blends. Its spatial resolution enables visualization of sub-micrometer and sub-nanometer morphology and structure. However, recent advances mean that AFMs can also measure the physical properties and functional behavior of polymers at small length scales. In addition to familiar topographic imaging, AFMs can probe molecular-level forces; map mechanical, thermal, and electrical properties; and assess solvent and thermal effects in near real time. This webinar provides an overview of the AFM's powerful capabilities for polymers characterization. Several new and exciting techniques for measuring nanoscale viscoelastic properties are presented, and their application to rubber blends for tire research is described. With examples to illustrate its versatility, this webinar highlights the impact of the AFM on current polymers research and development.
Who should attend:
Researchers in both academia and industry, including:
- Polymer scientists and engineers
- Scientists using microscopy, especially atomic force microscopy
- Researchers using indentation for nanomechanical characterization
- Managers and instructors of multi-user microscopy or nanotechnology centers
Key Learning Objectives:
- AFM methods for fast topographic imaging, even in liquids and at high temperatures
- Recent advances in viscoelastic measurements
- Nanomechanical mapping of rubber blends
- AFM techniques to probe electrical and functional behavior
By registering for this webinar, your contact information may be shared with the webinar sponsor.
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