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Dr. Chanmin Su, Senior Director Research & Measurement Sciences, Bruker Nano Surfaces

Dr. Chanmin Su is the Senior Director of Technology at Bruker Corporation’s Bruker Nano Surfaces for their AFM business. He is the inventor or co-inventor of 26 issued US patents in AFM systems and technologies, including patents for breakthrough PeakForce Tapping technology and the FastScan AFM. Dr. Su received his PhD from the Chinese Academy of Science in 1988. After serving two years as Visiting Scientist at KFA Juelich, one year as Manager for the Center for Microscopy & Microanalysis at the University of Maryland, and two years as Principle Scientist for Raytheon Technical Services Company, he joined Veeco Instruments in 2000 as a Senior Staff Scientist to develop AFM systems. He served as Director of Research from 2005 to 2008, and was appointed Senior Director of Technology upon Veeco’s sale of their instrumentation business to Bruker.

During his tenure with Veeco and Bruker, Dr. Su has initiated and led many product developments leading to new applications of scanning probe technologies.     [ Click for More ]