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Ronald Schrimpf, Vanderbilt University

 


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CC5.01 - Physical Mechanisms Affecting the Reliability of GaN-Based High Electron Mobility Transistors 
Date/Time:
April 8, 2015   8:00am - 8:30am
 
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Power Electronics with Wide Bandgap Materials 
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Date/Time:
May 20, 2015   12:00pm - 1:30pm
 
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2 Results Found, Showing 1 - 2