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Xiao Sun

Affiliation
Yale University

 


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CC4.01 - Electrical Characterization of Gate Traps in FETs with Ge and III-V Channels 
Date/Time:
April 7, 2015   3:15pm - 3:45pm
 
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Taxonomy
III-V 
 
 
 

 
1 Results Found, Showing 1 - 1