Keyword Suggestions

Results
 
 
 

Session Information

DD15.01 - Mott-Memories Based on the Narrow Gap Mott Insulators GaM4X8 (M = V, Nb, Ta ; X = S, Se) 
Date/Time:
April 5, 2013   8:45am - 9:00am
 
Speaker:
 
Taxonomy
 
Share:
 


 
 

Ratings

 
Average Rating: (No Ratings)
  Was great, surpassed expectations, and I would recommend this
  Was good, met expectations, and I would recommend this
  Was okay, met most expectations
  Was okay but did not meet expectations
  Was bad and I would not recommend this
 



Submit
 

Users Also Viewed

High Resolution Topography Characterization at Die-Scale of Front End CMP Processes
Reducing Density-induced CMP Non-uniformity for Advanced Semiconductor Technology Nodes
Slurry Compositions for Polishing Several New Barrier Films
Fluorescence Correlation Spectroscopic Investigation of Surface Adsorption of CMP Slurry Additives on Abrasive Particles
Characterization of Chemically Modified Thin Films for Optimization of Metal CMP Applications