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Using a New Coincident X-ray Photoelectron Spectroscopy and Raman Spectroscopy System for More Comprehensive Materials Analysis 
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Date/Time:
May 5, 2016   11:00am - 12:00pm
 
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Raman spectroscopy and X-ray photoelectron spectroscopy deliver complementary information but until recently this had to be collected using separate instruments. This makes true correlative measurements from exactly the same position difficult; necessitating additional software to match locations. By using a small form factor spectrometer, engineered to interface with the XPS vacuum system, data can be collected from exactly the same position on the sample. In this webinar, we will discuss the benefits of a combined approach, illustrated with some applications examples, to show how the combination of molecular spectroscopy and surface analysis offers unique opportunities for materials analysis.

Who should attend:
Researchers from both academia and industry whose focus area is Raman spectroscopy and/or X-ray photoelectron spectroscopy.

Key Learning Objective:
The objective of this webinar is to learn how combining Raman and XPS for various applications can save time and offer unique opportunities in materials analysis.
 


 
 
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