Keyword Suggestions

Results
 
 
Account Login
 
 
 
 
 

Library Navigation

 
 

Browse Meetings

 
 
 
I4.04 - Crosslinking of Self-Healing Polymer for Improved Cycling Stability of Silicon Negative Electrodes for Li-Ion Batteries 
Date/Time:
April 8, 2015   9:45am - 10:00am
 
Speaker:
 
Taxonomy
 
 
 
 
 
Share:
 

In recent work, our group has demonstrated improved cycling performance of silicon (Si) negative electrodes for lithium ion (Li-ion) batteries though the use of a self-healing polymer (SHP) binder. Our work was successful in utilizing commercially available micron sized particles to produce cells that were stable for over 100 cycles1. This work details further investigation into the effects of increased crosslinking on the performance of the SHP in the Si electrodes. Crosslinking was varied using a combination of difunctional and trifunctional molecules as the starting materials for the supramolecular SHPs. Additionally, a covalent crosslinker was used in some samples to examine the effects of static crosslinks as compared to the dynamic hydrogen bonding of the SHP. Standard mechanical tensile measurements were performed in addition to creep and stress relaxation experiments used to determine characteristic relaxation times for each material from viscoelastic theory. Cell cycling performance was correlated to this data and a relationship between mechanical characteristics, Li-ion conductivity, and cycling stability was seen. This work represents a step toward understanding the reasons behind performance improvements seen in the Si electrodes with SHP and will allow us to begin to tailor molecular structures of self-healing polymer binders specifically for battery applications. 1. Wang, C. et al. Self-healing chemistry enables the stable operation of silicon microparticle anodes for high-energy lithium-ion batteries. Nat Chem 5, 1042�1048 (2013).
 


 
 
Average Rating: (No Ratings)
  Was great, surpassed expectations, and I would recommend this
  Was good, met expectations, and I would recommend this
  Was okay, met most expectations
  Was okay but did not meet expectations
  Was bad and I would not recommend this
 



Submit
 
Group III-Sb Metamorphic Buffer on Si for p-Channel all-III-V CMOS: Electrical Properties, Growth and Surface Defects
Kinetics and Structure of Nickelide Contact Formation to InGaAs Fin Channels
Recent Progress in Understanding the Electrical Reliability of GaN High-Electron Mobility Transistors
The Effect of ALD Temperature on Border Traps in Al2O3 InGaAs Gate Stacks
Atomic Layer Deposition of Crystalline SrHfxTi1-xO3 Directly on Ge (001) for High-K Dielectric Applications