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SS2.03 - Characterizing Crystal Growth by Oriented Aggregation 
Date/Time:
April 22, 2014   2:30pm - 2:45pm
 
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Oriented attachment is a non-classical crystal growth mechanism that can be exploited to produce nanocrystals with unique and symmetry-defying shapes. In addition, this mechanism can result in twinning as well as the incorporation of defects like dislocations and stacking faults. Primary crystallites attach to one another and reorient with respect to one another. Secondary particles that can have high degrees of crystallographic order result. Comprehensive characterization is critical for elucidating the fundamental processes governing crystal growth by oriented aggregation and how it can influence microstructure and subsequent phase transformations. Transmission electron microscopy (TEM), cryogenic TEM, and in situ fluid cell TEM enable direct imaging of materials throughout the growth process. Correlative techniques, such as X-ray diffraction (XRD), small angle X-ray scattering (SAXS), small angle neutron scattering (SANS), dynamic light scattering (DLS), and UV-visible spectroscopy, as well as kinetic modeling, also lead to important insights. Each of these techniques has advantages and limitations, and a combination of methods is crucial to push our understanding of oriented attachment forward.
 


 
 
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